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PD - 97100 PDP SWITCH Features l Advanced Process Technology l Key Parameters Optimized for PDP Sustain, Energy Recovery and Pass Switch Applications l Low EPULSE Rating to Reduce Power Dissipation in PDP Sustain, Energy Recovery and Pass Switch Applications l Low QG for Fast Response l High Repetitive Peak Current Capability for Reliable Operation l Short Fall & Rise Times for Fast Switching l175C Operating Junction Temperature for Improved Ruggedness l Repetitive Avalanche Capability for Robustness and Reliability IRFP4332PBF Key Parameters 250 300 29 120 175 D VDS min VDS (Avalanche) typ. RDS(ON) typ. @ 10V IRP max @ TC= 100C TJ max D V V m: A C G S G D S TO-247AC D S G Description This HEXFET(R) Power MOSFET is specifically designed for Sustain; Energy Recovery & Pass switch applications in Plasma Display Panels. This MOSFET utilizes the latest processing techniques to achieve low on-resistance per silicon area and low EPULSE rating. Additional features of this MOSFET are 175C operating junction temperature and high repetitive peak current capability. These features combine to make this MOSFET a highly efficient, robust and reliable device for PDP driving applications. Gate Drain Source Absolute Maximum Ratings Parameter VGS ID @ TC = 25C ID @ TC = 100C IDM IRP @ TC = 100C PD @TC = 25C PD @TC = 100C TJ TSTG Gate-to-Source Voltage Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current c Repetitive Peak Current g Power Dissipation Power Dissipation Linear Derating Factor Operating Junction and Storage Temperature Range Soldering Temperature for 10 seconds Mounting Torque, 6-32 or M3 Screw 300 10lbxin (1.1Nxm) Typ. --- 0.24 --- Max. 0.42 --- 40 N Units C/W Max. 30 57 40 230 120 360 180 2.4 -40 to + 175 Units V A W W/C C Thermal Resistance Parameter RJC RCS RJA Junction-to-Case f Case-to-Sink, Flat, Greased Surface Junction-to-Ambient f Notes through are on page 8 www.irf.com 1 6/5/06 IRFP4332PBF Electrical Characteristics @ TJ = 25C (unless otherwise specified) Parameter BVDSS VDSS/TJ RDS(on) VGS(th) VGS(th)/TJ IDSS IGSS gfs Qg Qgd tst EPULSE Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Gate Threshold Voltage Coefficient Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Forward Transconductance Total Gate Charge Gate-to-Drain Charge Shoot Through Blocking Time Energy per Pulse Min. 250 --- --- 3.0 --- --- --- --- --- 100 --- --- 100 --- --- Typ. Max. Units --- 170 29 --- -14 --- --- --- --- --- 99 35 --- 520 920 5860 530 130 360 5.0 13 --- --- 33 5.0 --- 20 1.0 100 -100 --- 150 --- --- --- --- --- --- --- --- --- nH --- pF ns J S nC Conditions VGS = 0V, ID = 250A V mV/C Reference to 25C, ID = 1mA m VGS = 10V, ID = 35A e V mV/C A mA nA VDS = 250V, VGS = 0V VDS = 250V, VGS = 0V, TJ = 125C VGS = 20V VGS = -20V VDS = 25V, ID = 35A VDD = 125V, ID = 35A, VGS = 10Ve VDD = 200V, VGS = 15V, RG= 4.7 L = 220nH, C= 0.3F, VGS = 15V VDS = 200V, RG= 5.1, TJ = 25C L = 220nH, C= 0.3F, VGS = 15V VDS = 200V, RG= 5.1, TJ = 100C VGS = 0V VDS = 25V = 1.0MHz, VGS = 0V, VDS = 0V to 200V Between lead, 6mm (0.25in.) from package and center of die contact G S D VDS = VGS, ID = 250A Ciss Coss Crss Coss eff. LD LS Input Capacitance Output Capacitance Reverse Transfer Capacitance Effective Output Capacitance Internal Drain Inductance Internal Source Inductance --- --- --- --- --- --- Avalanche Characteristics Parameter Typ. Max. Units mJ mJ V A EAS EAR VDS(Avalanche) IAS Single Pulse Avalanche Energyd Repetitive Avalanche Energy c Repetitive Avalanche Voltage Avalanche Current d c --- --- 300 --- 210 36 --- 35 Diode Characteristics Parameter IS @ TC = 25C Continuous Source Current (Body Diode) ISM VSD trr Qrr Pulsed Source Current (Body Diode) c --- --- --- --- 190 820 1.3 290 1230 V ns nC Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge --- --- 230 Min. --- Typ. Max. Units --- 57 A Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ = 25C, IS = 35A, VGS = 0V e TJ = 25C, IF = 35A, VDD = 50V di/dt = 100A/s e 2 www.irf.com IRFP4332PBF 1000 TOP VGS 15V 10V 8.0V 7.0V 6.5V 6.0V 5.5V 1000 TOP VGS 15V 10V 8.0V 7.0V 6.5V 6.0V 5.5V 100 ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) BOTTOM 100 BOTTOM 5.5V 10 5.5V 10 1 0.1 1 60s PULSE WIDTH Tj = 25C 10 100 1 0.1 1 60s PULSE WIDTH Tj = 175C 10 100 VDS , Drain-to-Source Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 1000 Fig 2. Typical Output Characteristics 3.5 RDS(on) , Drain-to-Source On Resistance ID = 35A 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -60 -40 -20 ID, Drain-to-Source Current() 100 VGS = 10V TJ = 175C 10 1 TJ = 25C 0.1 VDS = 25V 60s PULSE WIDTH 0.01 4.0 5.0 6.0 7.0 8.0 (Normalized) 0 20 40 60 80 100 120 140 160 180 VGS, Gate-to-Source Voltage (V) TJ , Junction Temperature (C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature 1000 1000 800 Energy per pulse (J) Energy per pulse (J) L = 220nH C = 0.3F 100C 25C 800 L = 220nH C = Variable 100C 25C 600 600 400 400 200 200 0 150 160 170 180 190 200 0 100 110 120 130 140 150 160 170 VDS, Drain-to -Source Voltage (V) ID, Peak Drain Current (A) Fig 5. Typical EPULSE vs. Drain-to-Source Voltage Fig 6. Typical EPULSE vs. Drain Current www.irf.com 3 IRFP4332PBF 1400 1000 L = 220nH ISD , Reverse Drain Current (A) 1200 Energy per pulse (J) 1000 800 600 400 200 0 25 C= 0.3F C= 0.2F C= 0.1F 100 TJ = 175C 10 1 TJ = 25C VGS = 0V 0.1 50 75 100 125 150 0.2 0.4 0.6 0.8 1.0 1.2 Temperature (C) VSD, Source-to-Drain Voltage (V) Fig 7. Typical EPULSE vs.Temperature 10000 VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd Coss = Cds + Cgd Fig 8. Typical Source-Drain Diode Forward Voltage 20 VGS, Gate-to-Source Voltage (V) ID= 35A VDS = 200V VDS = 125V VDS = 50V 8000 16 C, Capacitance (pF) 6000 Ciss 12 4000 8 Coss 2000 4 Crss 0 1 10 100 1000 0 0 40 80 120 160 QG Total Gate Charge (nC) VDS , Drain-to-Source Voltage (V) Fig 9. Typical Capacitance vs.Drain-to-Source Voltage 60 Fig 10. Typical Gate Charge vs.Gate-to-Source Voltage 1000 ID, Drain-to-Source Current (A) 50 OPERATION IN THIS AREA LIMITED BY R DS (on) 1sec 100sec 10sec ID, Drain Current (A) 100 40 30 10 20 1 Tc = 25C Tj = 175C Single Pulse 0.1 1 10 100 1000 VDS , Drain-to-Source Voltage (V) 10 0 25 50 75 100 125 150 175 TJ, Junction Temperature (C) Fig 11. Maximum Drain Current vs. Case Temperature Fig 12. Maximum Safe Operating Area 4 www.irf.com IRFP4332PBF RDS (on), Drain-to -Source On Resistance ( ) EAS, Single Pulse Avalanche Energy (mJ) 0.40 1000 ID = 35A 0.30 800 ID 8.3A 13A BOTTOM 35A TOP 600 0.20 400 0.10 TJ = 125C TJ = 25C 200 0.00 5 6 7 8 9 10 0 25 50 75 100 125 150 175 VGS, Gate-to-Source Voltage (V) Starting TJ, Junction Temperature (C) Fig 13. On-Resistance Vs. Gate Voltage 5.0 Fig 14. Maximum Avalanche Energy Vs. Temperature 180 160 VGS(th) Gate threshold Voltage (V) Repetitive Peak Current (A) 4.0 140 120 100 80 60 40 20 ton= 1s Duty cycle = 0.25 Half Sine Wave Square Pulse ID = 250A 3.0 2.0 1.0 -75 -50 -25 0 25 50 75 100 125 150 175 0 25 50 75 100 125 150 175 TJ , Temperature ( C ) Case Temperature (C) Fig 15. Threshold Voltage vs. Temperature 1 Fig 16. Typical Repetitive peak Current vs. Case temperature Thermal Response ( Z thJC ) D = 0.50 0.1 0.20 0.10 0.05 J J 1 1 R1 R1 2 R2 R2 R3 R3 3 C 3 Ri (C/W) (sec) 0.01 0.02 0.01 SINGLE PULSE ( THERMAL RESPONSE ) 2 Ci= i/Ri Ci= i/Ri 0.069565 0.000074 0.172464 0.001546 0.178261 0.019117 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.0001 0.001 0.01 0.1 0.001 1E-006 1E-005 t1 , Rectangular Pulse Duration (sec) Fig 17. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFP4332PBF D.U.T Driver Gate Drive + P.W. Period D= P.W. Period VGS=10V + Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer *** D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt - - + RG * * * * * dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test VDD VDD ** + - Re-Applied Voltage Inductor Curent Body Diode Forward Drop Ripple 5% ISD * Use P-Channel Driver for P-Channel Measurements ** Reverse Polarity for P-Channel *** VGS = 5V for Logic Level Devices Fig 18. Diode Reverse Recovery Test Circuit for HEXFET(R) Power MOSFETs V(BR)DSS 15V tp DRIVER VDS L RG VGS 20V D.U.T IAS tp + V - DD A 0.01 I AS Fig 19a. Unclamped Inductive Test Circuit Current Regulator Same Type as D.U.T. Fig 19b. Unclamped Inductive Waveforms Id Vds 50K 12V .2F .3F Vgs D.U.T. VGS 3mA + V - DS Vgs(th) IG ID Qgs1 Qgs2 Qgd Qgodr Current Sampling Resistors Fig 20a. Gate Charge Test Circuit Fig 20b. Gate Charge Waveform 6 www.irf.com IRFP4332PBF A RG DRIVER L C PULSE A VCC B PULSE B RG Ipulse DUT tST Fig 21a. tst and EPULSE Test Circuit Fig 21b. tst Test Waveforms Fig 21c. EPULSE Test Waveforms www.irf.com 7 IRFP4332PBF TO-247AC Package Outline Dimensions are shown in millimeters (inches) TO-247AC Part Marking Information EXAMPLE: T HIS IS AN IRFPE30 WIT H AS SEMBLY LOT CODE 5657 ASS EMBLED ON WW 35, 2001 IN T HE AS SEMBLY LINE "H" Note: "P" in as s embly line pos ition indicates "Lead-Free" INT ERNAT IONAL RECT IFIER LOGO ASSEMBLY LOT CODE PART NUMBER IRF PE30 56 135H 57 DAT E CODE YEAR 1 = 2001 WEEK 35 LINE H TO-247AC package is not recommended for Surface Mount Application. Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25C, L = 0.35mH, RG = 25, IAS = 35A. Pulse width 400s; duty cycle 2%. R is measured at TJ of approximately 90C. Half sine wave with duty cycle = 0.25, ton=1sec. Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR's Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 06/06 8 www.irf.com |
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